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US Patent 11749501 Ion implantation apparatus
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Patent
Date Filed
September 8, 2021
Date of Patent
September 5, 2023
Patent Application Number
17468879
Patent Citations
US Patent 8225683 Wafer bow metrology arrangements and methods thereof
US Patent 9620402 Alignment apparatus and substrate processing apparatus
Patent Inventor Names
Weijiang Zhao
Jian Wang
Shinsuke Inoue
Takashi Sakamoto
Yuta Iwanami
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11749501
Patent Primary Examiner
Michael Maskell
CPC Code
H01L 21/046
H01J 2237/2065
H01J 2237/31706
H01J 37/304
H01J 37/20
H01J 37/3171
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