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US Patent 11756187 Systems and methods of optimal metrology guidance

Overview Structured Data Issues Contributors Activity

Is a

Date Filed

January 3, 2022

Date of Patent

September 12, 2023

Patent Application Number

17567847

Patent Citations

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Patent Inventor Names

Wentian Zhou

Teng Wang

Nan Zhao

Wei Fang

Ming Xu

Lingling Pu

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Patent Primary Examiner

CPC Code

G06T 2207/30168

G06T 2207/30148

G06T 2207/10061

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