US Patent 11761811 Measurement method, measurement device, measurement system, and measurement program

A measurement method includes: a step of acquiring, based on observation information obtained by an observation device, first observation point information including a time point when each of a plurality of parts of a moving object passes a first observation point of a structure and a physical quantity which is a response to an action of each of the plurality of parts on the first observation point; a step of acquiring, based on the observation information, second observation point information including a time point when each of the plurality of parts passes a second observation point and a physical quantity which is a response to an action of each of the plurality of parts on the second observation point; a step of calculating, based on the first observation point information, the second observation point information, a predetermined coefficient, and an approximate expression of deflection of the structure, a deflection waveform of the structure generated by each of the plurality of parts; and a step of calculating a deflection waveform of the structure generated by the moving object by adding the deflection waveform of the structure generated by each of the plurality of parts.