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US Patent 11774498 Multi-rate sampling for hierarchical system analysis

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Date Filed
June 7, 2021
Date of Patent
October 3, 2023
Patent Application Number
17340631
Patent Citations
‌
US Patent 9348680 Statistical design with importance sampling reuse
‌
US Patent 9483602 Method and system for identifying rare-event failure rates
‌
US Patent 9753895 Method for process variation analysis of an integrated circuit
‌
US Patent 9805158 Efficient extraction of K-sigma corners from Monte Carlo simulation
‌
US Patent 9940418 Simulation of hierarchical circuit element arrays
‌
US Patent 9836564 Efficient extraction of the worst sample in Monte Carlo simulation
‌
US Patent 11562110 System and method for device mismatch contribution computation for non-continuous circuit outputs
‌
US Patent 8122404 Performing a statistical timing abstraction for a hierarchical timing analysis of VLSI circuits
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US Patent 8453102 Hierarchical variation analysis of integrated circuits
Patent Inventor Names
Tong Li
Richard Daniel Kimmel
David Wells Winston
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11774498
Patent Primary Examiner
‌
James C. Kerveros
CPC Code
‌
G01R 31/318357
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G06N 20/00
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G01R 31/318314
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G01R 31/31901

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