Patent attributes
Systems and methods for generating an integrated circuit (IC) chip design are described. One of the methods includes receiving, on a data sheet, by a server, electrical parameters of a system on chip (SoC) to be designed. The method further includes receiving physical parameters of the SoC on the data sheet, generating a first design of the SoC according to the electrical parameters and the physical parameters, and receiving test parameters for testing the first design. The method further includes testing, via a design verification tool, the first design by applying the test parameters to the first design, receiving a second design of a second SoC, and coupling the second design to the first design to generate a first IC chip design. The method includes arranging the first IC chip design to be included on a shuttle for fabricating a first IC chip.
