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US Patent 11777036 Integrated assemblies and methods of forming integrated assemblies

Patent 11777036 was granted and assigned to Micron Technology on October, 2023 by the United States Patent and Trademark Office.

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Is a
Patent
Patent

Patent attributes

Patent Applicant
Micron Technology
Micron Technology
Current Assignee
Micron Technology
Micron Technology
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11777036
Patent Inventor Names
David K. Hwang
Gurtej S. Sandhu
Richard J. Hill
Date of Patent
October 3, 2023
Patent Application Number
17005054
Date Filed
August 27, 2020
Patent Citations
‌
US Patent 9991122 Methods of forming semiconductor device structures including two-dimensional material structures
‌
US Patent 9076686 Field effect transistor constructions and memory arrays
‌
US Patent 9276092 Transistors and methods of forming transistors
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US Patent 9276134 Field effect transistor constructions and memory arrays
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US Patent 10991826 Semiconductor device and methods of forming same
Patent Primary Examiner
‌
Ori Nadav
CPC Code
‌
H01L 29/42384
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H01L 29/78642
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H01L 27/127
‌
H01L 27/1262
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H01L 27/1255
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H01L 27/1214
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H01L 29/78618
Patent abstract

Some embodiments include an integrated assembly having an upwardly-extending structure with a sidewall surface. Two-dimensional-material extends along the sidewall surface. First electrostatic-doping-material is adjacent a lower region of the two-dimensional-material, insulative material is adjacent a central region of the two-dimensional-material, and second electrostatic-doping-material is adjacent an upper region of the two-dimensional-material. A conductive-gate-structure is over the first electrostatic-doping-material and adjacent to the insulative material. Some embodiments include methods of forming integrated assemblies.

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