US Patent 11906579 Wafer-level test method for optoelectronic chips
Patent 11906579 was granted and assigned to Jenoptik on February, 2024 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
June 19, 2020
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Date of Patent
February 20, 2024
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Patent Applicant
Patent Application Number
17770916
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Patent Inventor Names
Tobias Gnausch
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Robert Buettner
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Armin Grundmann
0
Christian Karras
0
Norik Janunts
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Thomas Kaden
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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