US Patent 11907088 Testing of hardware queue systems using on device test generation

An example system includes a processor that can receive a queue testing package. The processor can divide a hardware (HW) queue system to be tested into different types of queues. The processor can also generate a test using the different types of queues. The processor can further execute multiple instances of the generated test. The processor can also further compare results of the multiple instances of the test to detect a hardware fault in the hardware queue system.