US Patent 9858371 Method and system for generating post-silicon validation tests

A method for generating a minimized combined scenario for use in simulation, from a post-silicon validation test that includes a combined scenario, may include obtaining a failed scenario loop of a scenario of the combined scenario that includes combined action scenarios that were executed in loops during a post-silicon validation test of a system on chip; and adding any loops of other scenarios of the combined scenario that were executed at least partially concurrently with the failed scenario loop, while discarding any loops of other scenarios of the combined scenario that were completed during the post-silicon validation test before the failed scenario loop or did not commence before the failed scenario loop was completed.