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US Patent 11942977 System and method for continuous sampler calibration

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Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
119429770
Patent Inventor Names
Ryan Douglas Bespalko0
Shayan Shahramian0
Date of Patent
March 26, 2024
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Patent Application Number
172058420
Date Filed
March 18, 2021
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Patent Citations
‌
US Patent 10574487 Sampler offset calibration during operation
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US Patent 8074126 Non-intrusive eye monitor system
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Patent Primary Examiner
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Nader Bolourchi
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CPC Code
‌
H04B 1/1607
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Patent abstract

Methods and apparatuses for calibrating voltage offset of receiver data samplers in mission mode are described. The operating conditions, including the sampling threshold, of a first sampler are matched with those of a second sampler by adjusting the voltage offset of the second sampler. The voltage offset of the first sampler is adjusted in a first voltage direction until an error rate between the two samplers meets a threshold error value at a first threshold voltage offset value. The voltage offset of the first sampler is further adjusted in a second voltage direction, opposite of the first voltage direction, until the error rate between the two samplers meets the threshold error value at a second threshold voltage offset value. The voltage offset of the first sampler is adjusted to be an average value between the first threshold voltage offset value and the second threshold voltage offset value.

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