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US Patent 11942977 System and method for continuous sampler calibration

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
March 18, 2021
0
Date of Patent
March 26, 2024
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Patent Application Number
17205842
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Patent Citations
‌
US Patent 10574487 Sampler offset calibration during operation
0
‌
US Patent 8074126 Non-intrusive eye monitor system
0
Patent Inventor Names
Ryan Douglas Bespalko
0
Shayan Shahramian
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
11942977
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Patent Primary Examiner
‌
Nader Bolourchi
0
CPC Code
‌
H04B 1/1607
0

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