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US Patent 11972820 Non-volatile memory with tier-wise ramp down after program-verify

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119728200
Patent Inventor Names
Xiang Yang0
Dengtao Zhao0
Jiacen Guo0
Date of Patent
April 30, 2024
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Patent Application Number
178988500
Date Filed
August 30, 2022
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Patent Citations
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US Patent 9620233 Word line ramping down scheme to purge residual electrons
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US Patent 10157680 Sub-block mode for non-volatile memory
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US Patent 10276248 Early ramp down of dummy word line voltage during read to suppress select gate transistor downshift
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US Patent 10541037 Non-volatile memory with countermeasure for program disturb including delayed ramp down during program verify
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US Patent 10283202 Reducing disturbs with delayed ramp up of selected word line voltage after pre-charge during programming
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US Patent 10726920 Pre-charge voltage for inhibiting unselected NAND memory cell programming
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US Patent 8909493 Compensation for sub-block erase
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US Patent 9466369 Word line-dependent ramping of pass voltage and program voltage for three-dimensional memory
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Patent Primary Examiner
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Joshua L Schwartz
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CPC Code
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G11C 16/08
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G11C 16/102
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G11C 16/0433
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G11C 16/3459
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Patent abstract

Memory cells are arranged as NAND strings to form a block divided into sub-blocks, and each NAND string includes a dummy memory cell connected to a dummy word line. Memory cells are programmed by applying programming pulses to a selected word line in a selected sub-block with program-verify performed between pulses. Unselected NAND strings are inhibited from programming by boosting channels of the unselected NAND strings in the selected sub-block from a positive pre-charge voltage to a boosted voltage. The pre-charging of the channels of unselected NAND strings is performed while lowering voltages at the end of program-verify by applying overdrive voltages to data word lines in a sub-block closer to the source line than the selected sub-block and lowering to a resting voltage a dummy word line between the sub-blocks prior to lowering to a resting voltage the data word lines in the sub-block closer to the source line.

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