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US Patent 11988961 Radiation based patterning methods

Patent 11988961 was granted and assigned to Inpria on May, 2024 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Inpria
Inpria
0
Current Assignee
Inpria
Inpria
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119889610
Patent Inventor Names
Alan J. Telecky0
Andrew Grenville0
Douglas A. Keszler0
Jason K. Stowers0
Date of Patent
May 21, 2024
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Patent Application Number
182001250
Date Filed
May 22, 2023
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Patent Citations
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US Patent 7256129 Method for fabricating semiconductor device
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US Patent 7270886 Spin-on glass composition and method of forming silicon oxide layer in semiconductor manufacturing process using the same
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US Patent 8053370 Semiconductor device and fabrications thereof
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US Patent 8092703 Manufacturing method of semiconductor device
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US Patent 8158338 Resist sensitizer
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US Patent 8257910 Underlayers for EUV lithography
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US Patent 8415000 Patterned inorganic layers, radiation based patterning compositions and corresponding methods
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US Patent 8426107 Positive-type photosensitive composition
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...
Patent Primary Examiner
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Chanceity N Robinson
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CPC Code
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G03F 7/0042
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Patent abstract

Stabilized precursor solutions can be used to form radiation inorganic coating materials. The precursor solutions generally comprise metal suboxide cations, peroxide-based ligands and polyatomic anions. Design of the precursor solutions can be performed to achieve a high level of stability of the precursor solutions. The resulting coating materials can be designed for patterning with a selected radiation, such as ultraviolet light, x-ray radiation or electron beam radiation. The radiation patterned coating material can have a high contrast with respect to material properties, such that development of a latent image can be successful to form lines with very low line-width roughness and adjacent structures with a very small pitch.

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