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US Patent 12007418 Advanced charge transfer measurement techniques

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
June 30, 2022
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Date of Patent
June 11, 2024
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Patent Application Number
17855295
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Patent Citations
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US Patent 7288946 Methods and systems for detecting a capacitance using sigma-delta measurement techniques
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US Patent 7830158 Time-sloped capacitance measuring circuits and methods
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US Patent 7863909 System and method for measuring a capacitance by transferring charge from a fixed source
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US Patent 8395395 Noise rejection and parasitic capacitance removal implementations
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US Patent 8531193 Method and device for capacitive detection of objects
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US Patent 8659306 Parasitic capacitance cancellation in capacitive measurement applications
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US Patent 8847802 Microcontroller ADC with a variable sample and hold capacitor
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US Patent 8847811 Serial-ripple analog-to-digital conversion
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US Patent 8896327 Current mirror self-capacitance measurement
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US Patent 9071264 Microcontroller with sequencer driven analog-to-digital converter
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•••
Patent Inventor Names
Nico Johann Swanepoel
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Daniel Barend Rademeyer
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Frederick Johannes Bruwer
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
12007418
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Patent Primary Examiner
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Tung X Nguyen
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CPC Code
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G01R 19/16576
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G01R 31/34
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