US Patent 7092826 Semiconductor wafer inspection system
Patent 7092826 was granted and assigned to Qcept Technologies on August, 2006 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
June 17, 2005
0
Date of Patent
August 15, 2006
0
Patent Application Number
11156088
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Patent Inventor Names
M. Brandon Steele
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Jeffrey Alan Hawthorne
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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