Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Jeffrey F. Hanson0
Ryan C. Fredrickson0
Date of Patent
September 26, 2006
0Patent Application Number
106962030
Date Filed
October 29, 2003
0Patent Primary Examiner
Patent abstract
A method for producing yield enhancement data from integrated circuits on a substrate. A database of defects on the substrate is compared to a database of design information for the integrated circuits. The defects on the substrate are associated with classes of design information to produce the yield enhancement data.
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