US Patent 7114143 Process yield learning
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Patent Inventor Names
Jeffrey F. Hanson0
Ryan C. Fredrickson0
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Patent abstract
A method for producing yield enhancement data from integrated circuits on a substrate. A database of defects on the substrate is compared to a database of design information for the integrated circuits. The defects on the substrate are associated with classes of design information to produce the yield enhancement data.
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US Patent 07114143 Process yield learning US Patent 7114143 Process yield learning
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Patent Number
071141430
Patent Number
71141430
Edits on 18 May, 2023
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Patent Jurisdiction
Patent Number
071141430
Date of Patent
September 26, 2006
0Patent Application Number
106962030
Date Filed
October 29, 2003
0Official Website
Patent Primary Examiner
Edits on 7 Jun, 2022
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US Patent 07114143 Process yield learning
Infobox
Is a
Patent jurisdiction
Patent number
07114143
Date of patent
September 26, 2006
Patent application number
10696203
Date Filed
October 29, 2003
Patent primary examiner
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