Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
June 19, 2007
Patent Application Number
11100302
Date Filed
April 6, 2005
Patent Citations Received
Patent Primary Examiner
Patent abstract
An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.