Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Chye Lin Toh0
Boon Kiat Alex Chew0
Date of Patent
December 11, 2007
0Patent Application Number
116016090
Date Filed
November 17, 2006
0Patent Primary Examiner
Patent abstract
A test socket for an integrated circuit, wherein the test socket has a first plurality of test points for making electrical contact with contacts of a laminate package and a second plurality of test points for making electrical contact with contacts of a lead frame package. The test socket is suitable for testing, at one time: a laminate package, or a lead frame package, or both a laminate package and a lead frame package.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.