US Patent 7308367 Wafer inspection system
Patent 7308367 was granted and assigned to Qcept Technologies on December, 2007 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
February 3, 2004
0
Date of Patent
December 11, 2007
0
Patent Application Number
10771628
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Patent Inventor Names
Jeffrey Alan Hawthorne
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M. Brandon Steele
0
Chunho Kim
0
David C. Sowell
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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