An IC socket for testing an IC package is provided including a socket body (10), a press cover (14) preferably pivotally mounted to a first longitudinal end (101) of the socket body so as to be rotatable with respect to the socket body, and a press member (12) disposed between the socket body and the press cover to have an end thereof (121) essentially pivotally mounted to the press cover at a position adjacent the first longitudinal end of the socket body. Thus, by providing the mounting of the press member to the press cover at such a position, a latching member (141) detachably attached to the press cover will be less damaged in comparison with the conventional IC socket.