US Patent 7379826 Semiconductor wafer inspection system
Patent 7379826 was granted and assigned to Qcept Technologies on May, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 15, 2006
0
Date of Patent
May 27, 2008
0
Patent Application Number
11504486
0
Patent Inventor Names
Jeffrey Alan Hawthorne
0
M. Brandon Steele
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
Find more entities like US Patent 7379826 Semiconductor wafer inspection system
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
