US Patent 7390681 Derived metric for monitoring die placement
Patent 7390681 was granted and assigned to Advanced Micro Devices on June, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
January 12, 2007
Date of Patent
June 24, 2008
Patent Application Number
11622635
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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