Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Richard Campbell0
Date of Patent
July 22, 2008
0Patent Application Number
117101490
Date Filed
February 22, 2007
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.
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