US Patent 7403028 Test structure and probe for differential signals
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Patent Inventor Names
Richard Campbell0
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Patent abstract
A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.
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US Patent 07403028 Test structure and probe for differential signals US Patent 7403028 Test structure and probe for differential signals
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Patent Number
074030280
Patent Number
74030280
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Patent Number
074030280
Date of Patent
July 22, 2008
0Patent Application Number
117101490
Date Filed
February 22, 2007
0Official Website
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US Patent 07403028 Test structure and probe for differential signals
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Is a
Patent jurisdiction
Patent number
07403028
Date of patent
July 22, 2008
Patent application number
11710149
Date Filed
February 22, 2007
Patent primary examiner
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