Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hiroaki Nishimine0
Hirokatsu Niijima0
Takeo Miura0
Date of Patent
August 5, 2008
0Patent Application Number
114951860
Date Filed
July 28, 2006
0Patent Primary Examiner
Patent abstract
A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
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