US Patent 7409615 Test apparatus and test method
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Hiroaki Nishimine0
Hirokatsu Niijima0
Takeo Miura0
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Patent abstract
A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
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US Patent 07409615 Test apparatus and test method US Patent 7409615 Test apparatus and test method
Infobox
Patent Number
074096150
Patent Number
74096150
Edits on 6 Apr, 2023
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Patent Jurisdiction
Patent Number
074096150
Date of Patent
August 5, 2008
0Patent Application Number
114951860
Date Filed
July 28, 2006
0Official Website
Patent Primary Examiner
Edits on 9 Jun, 2022
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US Patent 07409615 Test apparatus and test method
Infobox
Is a
Patent jurisdiction
Patent number
07409615
Date of patent
August 5, 2008
Patent application number
11495186
Date Filed
July 28, 2006
Patent primary examiner
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