Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kouichi Hirae0
Date of Patent
August 19, 2008
0Patent Application Number
113453960
Date Filed
February 2, 2006
0Patent Primary Examiner
Patent abstract
Input test pads of an adjacent pattern area are placed in a vacant area of a layout area of output test pads, optimizing the layout area of test pads for use in inspection of a semiconductor chip. Thus, it is possible to miniaturize a semiconductor package.
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