US Patent 7414323 Tab tape and method of manufacturing the same
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Patent Inventor Names
Kouichi Hirae0
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Patent abstract
Input test pads of an adjacent pattern area are placed in a vacant area of a layout area of output test pads, optimizing the layout area of test pads for use in inspection of a semiconductor chip. Thus, it is possible to miniaturize a semiconductor package.
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US Patent 07414323 Tab tape and method of manufacturing the same US Patent 7414323 Tab tape and method of manufacturing the same
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Patent Number
074143230
Patent Number
74143230
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Official Website
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Patent Jurisdiction
Patent Number
074143230
Date of Patent
August 19, 2008
0Patent Application Number
113453960
Date Filed
February 2, 2006
0Official Website
Patent Primary Examiner
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US Patent 07414323 Tab tape and method of manufacturing the same
Infobox
Is a
Patent jurisdiction
Patent number
07414323
Date of patent
August 19, 2008
Patent application number
11345396
Date Filed
February 2, 2006
Patent primary examiner
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