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US Patent 7455450 Method and apparatus for temperature sensing in integrated circuits

Patent 7455450 was granted and assigned to Advanced Micro Devices on November, 2008 by the United States Patent and Trademark Office.

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Patent
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Patent attributes

Current Assignee
Advanced Micro Devices
Advanced Micro Devices
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
74554500
Date of Patent
November 25, 2008
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Patent Application Number
112468550
Date Filed
October 7, 2005
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Patent Citations Received
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US Patent 12123908 Loopback testing of integrated circuits
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US Patent 12013800 Die-to-die and chip-to-chip connectivity monitoring
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US Patent 12072376 Die-to-die connectivity monitoring
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US Patent 12092684 Integrated circuit workload, temperature, and/or sub-threshold leakage sensor
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US Patent 11762789 Integrated circuit I/O integrity and degradation monitoring
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US Patent 11841395 Integrated circuit margin measurement and failure prediction device
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US Patent 11929131 Memory device degradation monitoring
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Patent Primary Examiner
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Gail Verbitsky
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Patent abstract

A method and apparatus for temperature sensing in an IC. The IC includes a plurality of remote temperature sensors each coupled to a control logic unit. The plurality of remote temperature sensors may be distributed throughout the integrated circuit. The integrated circuit includes a reference unit coupled to provide a reference temperature to the control logic unit and a reference sensor coupled to provide a signal having a reference frequency to the control logic unit. The reference unit and the reference sensor are located near each other. The control logic unit is configured to correlate the reference frequency received from the reference sensor with the reference temperature received from the reference unit. The control logic unit is further configured to determine the temperature of each of the remote temperature sensors based on this correlation, and also configured to determine the maximum temperature of all of the temperature sensors.

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