Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
February 10, 2009
0Patent Application Number
119772800
Date Filed
October 24, 2007
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.
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