US Patent 7489149 Shielded probe for testing a device under test
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Patent abstract
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.
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Patent Jurisdiction
Patent Number
74891490
Date of Patent
February 10, 2009
0Patent Application Number
119772800
Date Filed
October 24, 2007
0Patent Primary Examiner
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US Patent 07489149 Shielded probe for testing a device under test US Patent 7489149 Shielded probe for testing a device under test
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Patent Number
0748914900
Patent Number
748914900
Edits on 29 Mar, 2023
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Infobox
Is a
Patent Jurisdiction
Patent Number
074891490
Date of Patent
February 10, 2009
0Patent Application Number
119772800
Date Filed
October 24, 2007
0Official Website
Patent Primary Examiner
Edits on 22 Sep, 2022
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
074891490
Date of Patent
February 10, 2009
0Patent Application Number
119772800
Date Filed
October 24, 2007
0Official Website
Patent Primary Examiner
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Golden AI
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US Patent 07489149 Shielded probe for testing a device under test
Infobox
Is a
Patent jurisdiction
Patent number
07489149
Date of patent
February 10, 2009
Patent application number
11977280
Date Filed
October 24, 2007
Patent primary examiner
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