Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Mitsuo Miyazaki0
Kazuhiko Shimabayashi0
Date of Patent
February 24, 2009
0Patent Application Number
114018930
Date Filed
April 12, 2006
0Patent Primary Examiner
Patent abstract
An inspection device of a semiconductor device includes a socket where the semiconductor device is installed, and a measuring part configured to inspect an electrical property of the semiconductor device. A standard sample and the socket are provided in a body. A standard value of the standard sample is stored in the measuring part. Whether there is abnormality of the measuring part is determined by comparing a value of the standard sample measured by the measuring part and the standard value.
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