US Patent 7538323 Interferometer
Patent 7538323 was granted and assigned to Riken on May, 2009 by the United States Patent and Trademark Office.
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Patent Inventor Names
Ken Harada0
Noboru Moriya0
Tetsuya Akashi0
Tsuyoshi Matsuda0
Yoshihiko Togawa0
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Patent abstract
The present invention provides a technique enabling to control fringe spacing s and an interference width W independently of each other, which are important parameters for an interferometer using an electron biprism.
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US Patent 07538323 Interferometer US Patent 7538323 Interferometer
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Patent Number
07538323
Patent Number
7538323
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US Patent 07538323 Interferometer
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Is a
Current assignee
Patent jurisdiction
Patent number
07538323
Date of patent
May 26, 2009
Patent application number
10585359
Date Filed
January 7, 2005
Patent primary examiner
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