Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Jae-Hyuk Im0
Jae-Il Kim0
Date of Patent
June 2, 2009
0Patent Application Number
114780760
Date Filed
June 30, 2006
0Patent Primary Examiner
Patent abstract
A test device that can improve test reliability is provided. In the test device, an error detecting unit detects an error of inputted test signals to generate an error flag, a normal test unit performs a test operation according to the test signals when the error flag is deactivated, and an error information providing unit indicates the error of the test signals when the error flag is activated.
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