US Patent 7543199 Test device
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Patent Inventor Names
Jae-Hyuk Im0
Jae-Il Kim0
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Article (+413 characters)
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Patent abstract
A test device that can improve test reliability is provided. In the test device, an error detecting unit detects an error of inputted test signals to generate an error flag, a normal test unit performs a test operation according to the test signals when the error flag is deactivated, and an error information providing unit indicates the error of the test signals when the error flag is activated.
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US Patent 07543199 Test device US Patent 7543199 Test device
Infobox
Patent Number
075431990
Patent Number
75431990
Edits on 21 May, 2023
Golden AI
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Patent Jurisdiction
Patent Number
075431990
Date of Patent
June 2, 2009
0Patent Application Number
114780760
Date Filed
June 30, 2006
0Official Website
Patent Primary Examiner
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US Patent 07543199 Test device
Infobox
Is a
Patent jurisdiction
Patent number
07543199
Date of patent
June 2, 2009
Patent application number
11478076
Date Filed
June 30, 2006
Patent primary examiner
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