US Patent 7554667 Method and apparatus for characterizing hyperspectral instruments

A method and apparatus for characterizing the spectral response function of hyperspectral electro-optical instruments or imaging spectrometers are provided. The system includes a test instrument that provides energy comprising multiple discrete wavelengths to the entrance slit of an instrument under test simultaneously. The provided energy can be scanned in the spectral dimension by changing the optical distance between the plates of a Fabry-Perot etalon incorporated into the test instrument. In addition, the energy provided to the instrument under test can be scanned in the spatial dimension by changing the location along the slit of the instrument under test at which the energy from the test instrument is provided.