Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
June 30, 2009
Patent Application Number
11465700
Date Filed
August 18, 2006
Patent Primary Examiner
Patent abstract
A method and apparatus for characterizing the spectral response function of hyperspectral electro-optical instruments or imaging spectrometers are provided. The system includes a test instrument that provides energy comprising multiple discrete wavelengths to the entrance slit of an instrument under test simultaneously. The provided energy can be scanned in the spectral dimension by changing the optical distance between the plates of a Fabry-Perot etalon incorporated into the test instrument. In addition, the energy provided to the instrument under test can be scanned in the spatial dimension by changing the location along the slit of the instrument under test at which the energy from the test instrument is provided.
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