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US Patent 7561279 Scanning simultaneous phase-shifting interferometer

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Patent Citations Received
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US Patent 12000698 Polarization-separated, phase-shifted interferometer
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Patent Inventor Names
Piotr Szwaykowski0
Raymond Castonguay0
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Patent abstract

An optical measuring apparatus for comprising, in combination, a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams, an array of detectors arranged in a line for creating a plurality of phase shifting interferograms, and a scanning device for moving the object in a direction perpendicular to a long axis of the detectors.

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US Patent 07561279 Scanning simultaneous phase-shifting interferometer US Patent 7561279 Scanning simultaneous phase-shifting interferometer

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Patent Number
075612790
Patent Number
75612790
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=075612790
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Infobox
Is a
Patent
Patent
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
075612790
Date of Patent
July 14, 2009
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Patent Application Number
117705820
Date Filed
June 28, 2007
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=075612790
Patent Primary Examiner
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Tarifur Chowdhury
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07561279
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 US Patent 07561279 Scanning simultaneous phase-shifting interferometer

Infobox
Is a
Patent
Patent
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07561279
Date of patent
July 14, 2009
Patent application number
11770582
Date Filed
June 28, 2007
Patent primary examiner
‌
Tarifur Chowdhury

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