US Patent 7584392 Test compaction using linear-matrix driven scan chains
Patent 7584392 was granted and assigned to Cadence Design Systems on September, 2009 by the United States Patent and Trademark Office.
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Patent abstract
A scan technique using linear matrix to drive scan chains is used, along with an ATPG, to constraint scan test vectors to be generated through the linear matrix. The linear matrix scan technique reduces the test application time and the amount of test vector data by several orders of magnitude over conventional techniques, without reducing fault coverage.
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US Patent 07584392 Test compaction using linear-matrix driven scan chains US Patent 7584392 Test compaction using linear-matrix driven scan chains
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Patent Number
0758439200
Patent Number
758439200
Edits on 4 Apr, 2023
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
075843920
Date of Patent
September 1, 2009
0Patent Application Number
106305370
Date Filed
July 29, 2003
0Official Website
Patent Primary Examiner
Edits on 23 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
075843920
Date of Patent
September 1, 2009
0Patent Application Number
106305370
Date Filed
July 29, 2003
0Official Website
Patent Primary Examiner
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US Patent 07584392 Test compaction using linear-matrix driven scan chains
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07584392
Date of patent
September 1, 2009
Patent application number
10630537
Date Filed
July 29, 2003
Patent primary examiner
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