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US Patent 7638028 Probe tip plating

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Is a

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Patent Inventor Names

Bahadir Tunaboylu0

David T. Beatson0

Edward L. Malantonio0

Andrew Hmiel0

Date of Patent

December 29, 2009

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Patent Application Number

111961940

Date Filed

August 3, 2005

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Patent Citations Received

US Patent 11973301 Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making

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US Patent 11761982 Probes with planar unbiased spring elements for electronic component contact and methods for making such probes

US Patent 11774467 Method of in situ modulation of structural material properties and/or template shape

US Patent 11802891 Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using

US Patent 11867721 Probes with multiple springs, methods for making, and methods for using

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US Patent 11906549 Compliant pin probes with flat extension springs, methods for making, and methods for using

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Patent Primary Examiner

0

Patent abstract

A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.

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