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US Patent 7638028 Probe tip plating

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Patent Citations Received
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US Patent 11973301 Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making
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US Patent 11867721 Probes with multiple springs, methods for making, and methods for using
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Patent Citations Received
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US Patent 11774467 Method of in situ modulation of structural material properties and/or template shape
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Patent Inventor Names
Andrew Hmiel0
Bahadir Tunaboylu0
David T. Beatson0
Edward L. Malantonio0
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Patent abstract

A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.

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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=076380280
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US Patent 07638028 Probe tip plating US Patent 7638028 Probe tip plating

Infobox
Patent Number
076380280
Patent Number
76380280
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Infobox
Is a
Patent
Patent
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
076380280
Date of Patent
December 29, 2009
0
Patent Application Number
111961940
Date Filed
August 3, 2005
0
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=076380280
Patent Primary Examiner
‌
Nam X Nguyen
0
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07638028
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created this topic on 3 Dec, 2021
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 US Patent 07638028 Probe tip plating

Infobox
Is a
Patent
Patent
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07638028
Date of patent
December 29, 2009
Patent application number
11196194
Date Filed
August 3, 2005
Patent primary examiner
‌
Nam X Nguyen

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