Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
January 5, 2010
Patent Application Number
12334992
Date Filed
December 15, 2008
Patent Primary Examiner
Patent abstract
A system, apparatus and method for testing and measuring high frequency signals on a trace is described. In one embodiment of the invention, a footprint is manufactured on a trace to allow the testing of a signal while reducing the amount of distortion caused by prior art structures and methods. The footprint is designed to reduce stub effects and capacitance on a signal being communicated on the trace.
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