US Patent 7642804 Testing high frequency signals on a trace
Patent 7642804 was granted and assigned to LSI Corporation on January, 2010 by the United States Patent and Trademark Office.
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Patent abstract
A system, apparatus and method for testing and measuring high frequency signals on a trace is described. In one embodiment of the invention, a footprint is manufactured on a trace to allow the testing of a signal while reducing the amount of distortion caused by prior art structures and methods. The footprint is designed to reduce stub effects and capacitance on a signal being communicated on the trace.
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US Patent 07642804 Testing high frequency signals on a trace US Patent 7642804 Testing high frequency signals on a trace
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Patent Number
0764280400
Patent Number
764280400
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
076428040
Date of Patent
January 5, 2010
0Patent Application Number
123349920
Date Filed
December 15, 2008
0Official Website
Patent Primary Examiner
Edits on 25 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
076428040
Date of Patent
January 5, 2010
0Patent Application Number
123349920
Date Filed
December 15, 2008
0Official Website
Patent Primary Examiner
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US Patent 07642804 Testing high frequency signals on a trace
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07642804
Date of patent
January 5, 2010
Patent application number
12334992
Date Filed
December 15, 2008
Patent primary examiner
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