Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
February 2, 2010
Patent Application Number
10718445
Date Filed
November 19, 2003
Patent Primary Examiner
Patent abstract
A method for testing an integrated circuit includes scanning test data from an input and an output pin into a first scan chain during a first state of a clock cycle, and scanning test data from the same input and output pins into a second scan chain during a second state of the clock cycle.
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