US Patent 7685483 Design features for testing integrated circuits
Patent 7685483 was granted and assigned to Lattice Semiconductor on March, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
June 20, 2005
Date of Patent
March 23, 2010
Patent Application Number
11157345
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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