Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
William McKnight0
Ui Won Suh0
Gigi Olive Gambrell0
Preeti Pisupati0
Date of Patent
March 30, 2010
0Patent Application Number
113145130
Date Filed
December 21, 2005
0Patent Citations Received
Patent Primary Examiner
0
Patent abstract
A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.
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