US Patent 7693419 Optical spectrum analysis using optical interferometry

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Patent Jurisdiction

Patent Number

Patent Inventor Names

Lianshan Yan0

Xiaojun Chen0

X. Steve Yao0

Date of Patent

April 6, 2010

Patent Application Number

115629610

Date Filed

November 22, 2006

Patent Primary Examiner

Patent abstract

Techniques and devices that use polarization rotation and optical interferometry to provide optical spectrum analysis of an optical signal.

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