US Patent 7693419 Optical spectrum analysis using optical interferometry
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Patent abstract
Techniques and devices that use polarization rotation and optical interferometry to provide optical spectrum analysis of an optical signal.
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Patent Inventor Names
Lianshan Yan0
X. Steve Yao0
Xiaojun Chen0
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US Patent 07693419 Optical spectrum analysis using optical interferometry US Patent 7693419 Optical spectrum analysis using optical interferometry
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Patent Number
076934190
Patent Number
76934190
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Patent Jurisdiction
Patent Number
076934190
Date of Patent
April 6, 2010
0Patent Application Number
115629610
Date Filed
November 22, 2006
0Official Website
Patent Primary Examiner
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US Patent 07693419 Optical spectrum analysis using optical interferometry
Infobox
Is a
Patent jurisdiction
Patent number
07693419
Date of patent
April 6, 2010
Patent application number
11562961
Date Filed
November 22, 2006
Patent primary examiner
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