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Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
June 15, 2010
Patent Application Number
11916591
Date Filed
June 15, 2006
Patent Primary Examiner
Patent abstract
A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A radiation detector is positioned offset with respect to the transmission path for detecting photons that are scattered from the transmission path in response to interaction with the specimen passing therethrough. A controller determines from the detected scattered photons that a first material is present in the specimen.
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