Patent 7738631 was granted and assigned to Endicott Interconnect Technologies, Inc. on June, 2010 by the United States Patent and Trademark Office.
A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A radiation detector is positioned offset with respect to the transmission path for detecting photons that are scattered from the transmission path in response to interaction with the specimen passing therethrough. A controller determines from the detected scattered photons that a first material is present in the specimen.